Development of nanotopography during SIMS characterization of thin films of Ge1-xSnx alloy
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Secchi, M, Demenev, E, Colaux, JL, Giubertoni, D, Dell'Anna, R, Iacob, E, Gwilliam, M, Jeynes, C and Bersani, M (2015) Development of nanotopography during SIMS characterization of thin films of Ge1-xSnx alloy APPLIED SURFACE SCIENCE, 356. pp. 422-428.
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Item Type: | Article |
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Divisions : | Surrey research (other units) |
Authors : | Secchi, M, Demenev, E, Colaux, JL, Giubertoni, D, Dell'Anna, R, Iacob, E, Gwilliam, M, Jeynes, C and Bersani, M |
Date : | 30 November 2015 |
DOI : | 10.1016/j.apsusc.2015.08.083 |
Uncontrolled Keywords : | Science & Technology, Physical Sciences, Technology, Chemistry, Physical, Materials Science, Coatings & Films, Physics, Applied, Physics, Condensed Matter, Chemistry, Materials Science, Physics, SIMS protocol, Ge1-xSnx, Nanotopography, Ripple, ION-BOMBARDMENT, SPECTROMETRY, TOPOGRAPHY, ROUGHNESS, GERMANIUM, SURFACES, CS+ |
Related URLs : | |
Depositing User : | Symplectic Elements |
Date Deposited : | 28 Mar 2017 10:57 |
Last Modified : | 24 Jan 2020 12:43 |
URI: | http://epubs.surrey.ac.uk/id/eprint/809686 |
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