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Accurate electronics calibration for particle backscattering spectrometry

Colaux, JL and Jeynes, C (2015) Accurate electronics calibration for particle backscattering spectrometry ANALYTICAL METHODS, 7 (7). pp. 3096-3104.

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Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Authors :
AuthorsEmailORCID
Colaux, JLUNSPECIFIEDUNSPECIFIED
Jeynes, CUNSPECIFIEDUNSPECIFIED
Date : 1 January 2015
Identification Number : 10.1039/c4ay02988g
Uncontrolled Keywords : Science & Technology, Physical Sciences, Life Sciences & Biomedicine, Technology, Chemistry, Analytical, Food Science & Technology, Spectroscopy, Chemistry, ANNEALING ANALYSIS, ION-IMPLANTATION, HE IONS, SI, SILICON, IBA, RBS, SCATTERING, SURREY
Related URLs :
Additional Information : Copyright 2015 Royal Society of Chemistry.
Depositing User : Symplectic Elements
Date Deposited : 12 May 2015 15:23
Last Modified : 29 Jan 2016 02:08
URI: http://epubs.surrey.ac.uk/id/eprint/807556

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