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Leveraging contact effects for field-effect transistor technologies with reduced complexity and superior current uniformity

Sporea, RA, Georgakopoulos, S, Shkunov, M, Shannon, JM, Silva, SRP, Xu, X and Guo, X (2013) Leveraging contact effects for field-effect transistor technologies with reduced complexity and superior current uniformity MRS Online Proceedings Library, 1553.

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Abstract

In order to achieve high performance, the design of devices for large-area electronics needs to be optimized despite material or fabrication shortcomings. In numerous emerging technologies thin-film transistor (TFT) performance is hindered by contact effects. Here, we show that contact effects can be used constructively to create devices with performance characteristics unachievable by conventional transistor designs. Source-gated transistors (SGTs) are not designed with increasing transistor speed, mobility or sub-threshold slope in mind, but rather with improving certain aspects critical for real-world large area electronics such as stability, uniformity, power efficiency and gain. SGTs can achieve considerably lower saturation voltage and power dissipation compared to conventional devices driven at the same current; higher output impedance for over two orders of magnitude higher intrinsic gain; improved bias stress stability in amorphous materials; higher resilience to processing variations; current virtually independent of source-drain gap, source-gate overlap and semiconductor thickness variations. Applications such as amplifiers and drivers for sensors and actuators, low cost large area analog or digital circuits could greatly benefit from incorporating the SGT architecture.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre
Authors :
AuthorsEmailORCID
Sporea, RAUNSPECIFIEDUNSPECIFIED
Georgakopoulos, SUNSPECIFIEDUNSPECIFIED
Shkunov, MUNSPECIFIEDUNSPECIFIED
Shannon, JMUNSPECIFIEDUNSPECIFIED
Silva, SRPUNSPECIFIEDUNSPECIFIED
Xu, XUNSPECIFIEDUNSPECIFIED
Guo, XUNSPECIFIEDUNSPECIFIED
Date : 7 November 2013
Identification Number : 10.1557/opl.2013.813
Additional Information : Copyright © Materials Research Society 2013. Reprinted with permission.
Depositing User : Symplectic Elements
Date Deposited : 03 Dec 2014 09:38
Last Modified : 13 Feb 2015 14:33
URI: http://epubs.surrey.ac.uk/id/eprint/806769

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