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Characterization of paint layers by simultaneous self-consistent fitting of RBS/PIXE spectra using simulated annealing

Beck, L, Jeynes, C and Barradas, NP (2008) Characterization of paint layers by simultaneous self-consistent fitting of RBS/PIXE spectra using simulated annealing NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 266 (8). pp. 1871-1874.

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Item Type: Article
Authors :
AuthorsEmailORCID
Beck, LUNSPECIFIEDUNSPECIFIED
Jeynes, CUNSPECIFIEDUNSPECIFIED
Barradas, NPUNSPECIFIEDUNSPECIFIED
Date : 1 April 2008
Identification Number : https://doi.org/10.1016/j.nimb.2007.12.091
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, ATOMIC, MOLECULAR & CHEMICAL, PHYSICS, NUCLEAR, PIXE, RBS, EBS, IBA, DataFurnace, paint layers, pigments, ION-BEAM ANALYSIS, X-RAY-EMISSION, SIMULTANEOUS PIXE, ANALYSIS SOFTWARE, ART, ROUGHNESS, OBJECTS
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Depositing User : Symplectic Elements
Date Deposited : 28 Mar 2017 13:14
Last Modified : 28 Mar 2017 13:14
URI: http://epubs.surrey.ac.uk/id/eprint/806504

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