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XPS analysis of small particles by proximal X-ray generation

Castle, JE, Grilli, R and Mallinson, CF (2014) XPS analysis of small particles by proximal X-ray generation Surface and Interface Analysis.

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Abstract

In this work, the feasibility of XPS analysis using locally generated Al K α radiation has been demonstrated. Both photo and Auger-electron signals can be obtained from a single, sub-micrometre, particle, achieving the aim of chemical state identi fi cation by means of the Auger parameter. The results, demonstrated in t his work using copper particles on an aluminium substrate, suggest that the technique, with further development, will be valuable for those concerned with the health hazards of nano-particles in general.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Mechanical Engineering Sciences
Authors :
AuthorsEmailORCID
Castle, JEUNSPECIFIEDUNSPECIFIED
Grilli, RUNSPECIFIEDUNSPECIFIED
Mallinson, CFUNSPECIFIEDUNSPECIFIED
Date : 18 March 2014
Depositing User : Christopher Mallinson
Date Deposited : 28 Mar 2017 13:12
Last Modified : 28 Mar 2017 13:12
URI: http://epubs.surrey.ac.uk/id/eprint/806119

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