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High accuracy traceable Rutherford backscattering spectrometry of ion implanted samples

Colaux, JL and Jeynes, C (2014) High accuracy traceable Rutherford backscattering spectrometry of ion implanted samples ANALYTICAL METHODS, 6 (1). pp. 120-129.

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Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Authors :
AuthorsEmailORCID
Colaux, JLUNSPECIFIEDUNSPECIFIED
Jeynes, CUNSPECIFIEDUNSPECIFIED
Date : 1 January 2014
Identification Number : 10.1039/c3ay41398e
Uncontrolled Keywords : Science & Technology, Physical Sciences, Life Sciences & Biomedicine, Technology, Chemistry, Analytical, Food Science & Technology, Spectroscopy, Chemistry, CHEMISTRY, ANALYTICAL, FOOD SCIENCE & TECHNOLOGY, SPECTROSCOPY, SCATTERING CROSS-SECTION, MONTE-CARLO-SIMULATION, BEAM ANALYSIS, CRYSTALLINE SI, RBS, CALIBRATION, ENERGY, IBA, SILICON, UNCERTAINTY
Related URLs :
Additional Information : Copyright 2014 Royal Society of Chemistry
Depositing User : Symplectic Elements
Date Deposited : 27 Jan 2014 12:10
Last Modified : 17 Jan 2015 14:52
URI: http://epubs.surrey.ac.uk/id/eprint/805055

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