University of Surrey

Test tubes in the lab Research in the ATI Dance Research

Reduction free carrier lifetime by ion induced defects in silicon

Wright, Nicholas (2009) Reduction free carrier lifetime by ion induced defects in silicon Doctoral thesis, University of Surrey.

[img]
Preview
Text
Wright2009.pdf
Available under License Creative Commons Attribution Non-commercial Share Alike.

Download (33MB) | Preview
Item Type: Thesis (Doctoral)
Divisions : Theses
Authors :
NameEmailORCID
Wright, Nicholas
Date : 2009
Contributors :
ContributionNameEmailORCID
http://www.loc.gov/loc.terms/relators/THS
Additional Information : Thesis submitted for the Degree of Doctor of Philosophy, University of Surrey. Copyright remains with the author.
Depositing User : Jonathan Brierley
Date Deposited : 29 Oct 2013 14:08
Last Modified : 26 Nov 2014 14:16
URI: http://epubs.surrey.ac.uk/id/eprint/804371

Actions (login required)

View Item View Item

Downloads

Downloads per month over past year


Information about this web site

© The University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom.
+44 (0)1483 300800