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The effects of material interfaces on thermal resistance values for high-power microwave transistors

Johnson, EM, Aaen, PH, Bridges, D and Wood, J (2012) The effects of material interfaces on thermal resistance values for high-power microwave transistors 79th ARFTG Microwave Measurement Conference: Non-Linear Measurement Systems, ARFTG 2012.

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Abstract

In this paper, we examine the effects that the thermal interface between materials has on the thermal resistance extracted from electrical measurements. We also examine the consequent degradation in electrical performance. We present the characterization of the transistor under various thermal environments: mounted in packages, using various die attachments, and on-wafer. A wide range of thermal resistances are extracted and we demonstrate the importance of proper characterization during on-wafer thermal measurements. Finite-element simulations show that we can account for various thermal interfaces by changing the coefficient of thermal transfer from the semiconductor device to the material beneath it. Simulations are shown to be in good agreement with measured results. © 2012 IEEE.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute
Authors :
AuthorsEmailORCID
Johnson, EMUNSPECIFIEDUNSPECIFIED
Aaen, PHUNSPECIFIEDUNSPECIFIED
Bridges, DUNSPECIFIEDUNSPECIFIED
Wood, JUNSPECIFIEDUNSPECIFIED
Date : 2012
Identification Number : 10.1109/ARFTG79.2012.6291196
Contributors :
ContributionNameEmailORCID
PublisherIEEE, UNSPECIFIEDUNSPECIFIED
Additional Information : © 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Depositing User : Symplectic Elements
Date Deposited : 26 Sep 2013 15:41
Last Modified : 09 Jun 2014 13:12
URI: http://epubs.surrey.ac.uk/id/eprint/803537

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