Characterization of CN films by X-ray emission measurements

Kurmaev, EZ, Shamin, SN, Moewes, A, Winarski, RP, Ederer, DL, Feng, JY and Turner, SS (2002) Characterization of CN films by X-ray emission measurements Thin Solid Films, 402 (1-2). pp. 60-64.

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Abstract

The local atomic bonding structure of carbon nitride films synthesized by the reactive ionized cluster beam method using X-ray emission spectra (XES) was examined. An ionized cluster beam system was used to prepare the carbon nitride films. The composition of carbon nitride films was measured with Rutherford backscattering spectroscopy techniques and the N/C ratio was found to be approximately 0.25. The XES measurements of the carbon nitride films showed a predominant proportion of sp bonded carbon and nitrogen atoms.

Item Type:	Article
Authors :	Authors Email ORCID Kurmaev, EZ UNSPECIFIED UNSPECIFIED Shamin, SN UNSPECIFIED UNSPECIFIED Moewes, A UNSPECIFIED UNSPECIFIED Winarski, RP UNSPECIFIED UNSPECIFIED Ederer, DL UNSPECIFIED UNSPECIFIED Feng, JY UNSPECIFIED UNSPECIFIED Turner, SS UNSPECIFIED UNSPECIFIED
Date :	1 January 2002
Identification Number :	https://doi.org/10.1016/S0040-6090(01)01686-8
Depositing User :	Symplectic Elements
Date Deposited :	28 Mar 2017 13:22
Last Modified :	28 Mar 2017 13:22
URI:	http://epubs.surrey.ac.uk/id/eprint/802884

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