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Thickness dependence of properties of excimer laser crystallized nano-polycrystalline silicon

Adikaari, AADT and Silva, SRP (2005) Thickness dependence of properties of excimer laser crystallized nano-polycrystalline silicon JOURNAL OF APPLIED PHYSICS, 97 (11). ? - ?. ISSN 0021-8979

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Item Type: Article
Uncontrolled Keywords: Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, THIN-FILM TRANSISTORS, HYDROGENATED AMORPHOUS-SILICON, CHEMICAL-VAPOR-DEPOSITION, SUPER-LATERAL GROWTH, A-SI-H, MICROCRYSTALLINE SILICON, SOLAR-CELLS, RAMAN-SPECTROSCOPY, VOLUME FRACTION, LOW-TEMPERATURE
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Divisions: Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre
Depositing User: Mr Adam Field
Date Deposited: 27 May 2010 14:05
Last Modified: 02 Nov 2014 14:34
URI: http://epubs.surrey.ac.uk/id/eprint/8

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