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Thickness dependence of properties of excimer laser crystallized nano-polycrystalline silicon

Adikaari, AADT and Silva, SRP (2005) Thickness dependence of properties of excimer laser crystallized nano-polycrystalline silicon JOURNAL OF APPLIED PHYSICS, 97 (11). ? - ?. ISSN 0021-8979

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Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre
Authors :
AuthorsEmail
Adikaari, AADTUNSPECIFIED
Silva, SRPUNSPECIFIED
Date : 1 June 2005
Identification Number : 10.1063/1.1898444
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, THIN-FILM TRANSISTORS, HYDROGENATED AMORPHOUS-SILICON, CHEMICAL-VAPOR-DEPOSITION, SUPER-LATERAL GROWTH, A-SI-H, MICROCRYSTALLINE SILICON, SOLAR-CELLS, RAMAN-SPECTROSCOPY, VOLUME FRACTION, LOW-TEMPERATURE
Related URLs :
Depositing User : Mr Adam Field
Date Deposited : 27 May 2010 14:05
Last Modified : 01 Mar 2015 02:36
URI: http://epubs.surrey.ac.uk/id/eprint/8

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