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Evaluation of particle-induced X-ray emission and particle-induced γ-ray emission of quartz grains for forensic trace sediment analysis.

Bailey, MJ, Morgan, RM, Comini, P, Calusi, S and Bull, PA (2012) Evaluation of particle-induced X-ray emission and particle-induced γ-ray emission of quartz grains for forensic trace sediment analysis. Anal Chem, 84 (5). pp. 2260-2267.

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Abstract

The independent verification in a forensics context of quartz grain morphological typing by scanning electron microscopy was demonstrated using particle-induced X-ray emission (PIXE) and particle-induced γ-ray emission (PIGE). Surface texture analysis by electron microscopy and high-sensitivity trace element mapping by PIXE and PIGE are independent analytical techniques for identifying the provenance of quartz in sediment samples in forensic investigations. Trace element profiling of the quartz grain matrix separately from the quartz grain inclusions served to differentiate grains of different provenance and indeed went some way toward discriminating between different quartz grain types identified in a single sample of one known forensic provenance. These results confirm the feasibility of independently verifying the provenance of critical samples from forensic cases.

Item Type: Article
Authors :
AuthorsEmailORCID
Bailey, MJUNSPECIFIEDUNSPECIFIED
Morgan, RMUNSPECIFIEDUNSPECIFIED
Comini, PUNSPECIFIEDUNSPECIFIED
Calusi, SUNSPECIFIEDUNSPECIFIED
Bull, PAUNSPECIFIEDUNSPECIFIED
Date : 6 March 2012
Identification Number : https://doi.org/10.1021/ac2028722
Depositing User : Symplectic Elements
Date Deposited : 28 Mar 2017 13:52
Last Modified : 28 Mar 2017 13:52
URI: http://epubs.surrey.ac.uk/id/eprint/795090

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