University of Surrey

Test tubes in the lab Research in the ATI Dance Research

On artefacts in the secondary ion mass spectrometry profiling of high fluence H+ implants in GaAs

Bailey, MJ, Jeynes, C, Sealy, BJ, Webb, RP and Gwilliam, RM (2010) On artefacts in the secondary ion mass spectrometry profiling of high fluence H+ implants in GaAs In: 19th International Conference on Ion Beam Analysis, 2009-09-07 - 2009-09-11, Univ Cambridge, Cambridge, ENGLAND.

[img] PDF
artefacts of SIMS for h profiling.pdf
Restricted to Repository staff only
Available under License : See the attached licence file.

Download (755kB)
[img] PDF (licence)
SRI_deposit_agreement.pdf
Restricted to Repository staff only
Available under License : See the attached licence file.

Download (33kB)
Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
AuthorsEmailORCID
Bailey, MJUNSPECIFIEDUNSPECIFIED
Jeynes, CUNSPECIFIEDUNSPECIFIED
Sealy, BJUNSPECIFIEDUNSPECIFIED
Webb, RPUNSPECIFIEDUNSPECIFIED
Gwilliam, RMUNSPECIFIEDUNSPECIFIED
Date : 1 June 2010
Identification Number : https://doi.org/10.1016/j.nimb.2010.02.033
Contributors :
ContributionNameEmailORCID
PublisherELSEVIER SCIENCE BV, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, SIMS, ERDA, Blistering, Hydrogen, Exfoliation, Smart-cut, Ion-cut, SILICON, TEMPERATURE, CUT, SMART-CUT(C), SUBSTRATE, SURFACE, SURREY
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 28 Mar 2017 13:51
Last Modified : 28 Mar 2017 13:51
URI: http://epubs.surrey.ac.uk/id/eprint/795087

Actions (login required)

View Item View Item

Downloads

Downloads per month over past year


Information about this web site

© The University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom.
+44 (0)1483 300800