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Characterising ion-cut in GaAs by Rutherford backscattering spectroscopy

Webb, M, Jeynes, C, Gwilliam, R, Royle, A and Sealy, B (2006) Characterising ion-cut in GaAs by Rutherford backscattering spectroscopy Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 249 (1-2). pp. 429-431.

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Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Chemistry
Authors :
NameEmailORCID
Webb, MUNSPECIFIEDUNSPECIFIED
Jeynes, CUNSPECIFIEDUNSPECIFIED
Gwilliam, RUNSPECIFIEDUNSPECIFIED
Royle, AUNSPECIFIEDUNSPECIFIED
Sealy, BUNSPECIFIEDUNSPECIFIED
Date : August 2006
Identification Number : 10.1016/j.nimb.2006.04.045
Uncontrolled Keywords : Ion-cut, Smart-cut, Exfoliation, Blistering
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 16 Aug 2013 08:53
Last Modified : 28 Mar 2017 13:51
URI: http://epubs.surrey.ac.uk/id/eprint/795069

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