Near-field scanning optical microscopy with monolithic silicon light emitting diode on probe tip
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Hoshino, K, Rozanski, LJ, Bout, DAV and Zhang, X (2008) Near-field scanning optical microscopy with monolithic silicon light emitting diode on probe tip APPLIED PHYSICS LETTERS, 92 (13). ? - ?. ISSN 0003-6951
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Official URL: http://dx.doi.org/10.1063/1.2904698
| Item Type: | Article |
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| Additional Information: | Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 92(13) 131106 and may be found at K. Hoshino et al., Appl. Phys.Lett. 92, 131106 (2008) |
| Uncontrolled Keywords: | Science & Technology, Physical Sciences, Physics, Applied, Physics, FOCUSED ION-BEAM, ELECTRICAL-PROPERTIES, N JUNCTIONS, ELECTROLUMINESCENCE, FABRICATION, APERTURE, IMPLANTATION, NSOM |
| Divisions: | Faculty of Engineering and Physical Sciences > Electronic Engineering |
| Related URLs: | |
| ID Code: | 7902 |
| Deposited By: | Symplectic Elements |
| Deposited On: | 01 Dec 2011 12:39 |
| Last Modified: | 30 Mar 2013 14:42 |
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