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Near-field scanning optical microscopy with monolithic silicon light emitting diode on probe tip

Hoshino, K, Rozanski, LJ, Bout, DAV and Zhang, X (2008) Near-field scanning optical microscopy with monolithic silicon light emitting diode on probe tip APPLIED PHYSICS LETTERS, 92 (13). ? - ?. ISSN 0003-6951

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Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

The following article appeared in Applied Physics Letters, 92(13) 131106 and may be found at K. Hoshino et al., Appl. Phys.Lett. 92, 131106 (2008)

Uncontrolled Keywords: Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, FOCUSED ION-BEAM, ELECTRICAL-PROPERTIES, N JUNCTIONS, ELECTROLUMINESCENCE, FABRICATION, APERTURE, IMPLANTATION, NSOM
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Divisions: Faculty of Engineering and Physical Sciences > Electronic Engineering
Depositing User: Symplectic Elements
Date Deposited: 01 Dec 2011 12:39
Last Modified: 20 Jul 2014 01:33
URI: http://epubs.surrey.ac.uk/id/eprint/7902

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