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Enhanced x-ray detection sensitivity in semiconducting polymer diodes containing metallic nanoparticles

Mills, CA, Al-Otaibi, H, Intaniwet, A, Shkunov, M, Pani, S, Keddie, JL and Sellin, PJ (2013) Enhanced x-ray detection sensitivity in semiconducting polymer diodes containing metallic nanoparticles Journal of Physics D: Applied Physics, 46 (27), 275102.

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Abstract

Semiconducting polymer X-radiation detectors are a completely new family of low-cost radiation detectors with potential application as beam monitors or dosimeters. These detectors are easy to process, mechanically flexible, relatively inexpensive, and able to cover large areas. However, their x-ray photocurrents are typically low as, being composed of elements of low atomic number (Z), they attenuate x-rays weakly. Here, the addition of high-Z nanoparticles is used to increase the x-ray attenuation without sacrificing the attractive properties of the host polymer. Two types of nanoparticles (NPs) are compared: metallic tantalum and electrically insulating bismuth oxide. The detection sensitivity of 5 µm thick semiconducting poly([9,9-dioctylfluorenyl-2,7-diyl]-co-bithiophene) diodes containing tantalum NPs is four times greater than that for the analogous NP-free devices; it is approximately double that of diodes containing an equal volume of bismuth oxide NPs. The x-ray induced photocurrent output of the diodes increases with an increased concentration of NPs. However, contrary to the results of theoretical x-ray attenuation calculations, the experimental current output is higher for the lower-Z tantalum diodes than the bismuth oxide diodes, at the same concentration of NP loading. This result is likely due to the higher tantalum NP electrical conductivity, which increases charge transport through the semiconducting polymer, leading to increased diode conductivity.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre
Authors :
AuthorsEmailORCID
Mills, CAUNSPECIFIEDUNSPECIFIED
Al-Otaibi, HUNSPECIFIEDUNSPECIFIED
Intaniwet, AUNSPECIFIEDUNSPECIFIED
Shkunov, MUNSPECIFIEDUNSPECIFIED
Pani, SUNSPECIFIEDUNSPECIFIED
Keddie, JLUNSPECIFIEDUNSPECIFIED
Sellin, PJUNSPECIFIEDUNSPECIFIED
Date : 19 June 2013
Identification Number : 10.1088/0022-3727/46/27/275102
Uncontrolled Keywords : X Ray, Polymer, Semiconductor, Dosimetry
Additional Information : Copyright 2013 Institute of Physics. This is the author's accepted manuscript.
Depositing User : Symplectic Elements
Date Deposited : 16 Aug 2013 09:14
Last Modified : 23 Sep 2013 20:10
URI: http://epubs.surrey.ac.uk/id/eprint/787061

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