Probing the phonon confinement in ultrasmall silicon nanocrystals reveals a size-dependent surface energy
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Crowe, IF, Halsall, MP, Hulko, O, Knights, AP, Gwilliam, RM, Wojdak, M and Kenyon, AJ (2011) Probing the phonon confinement in ultrasmall silicon nanocrystals reveals a size-dependent surface energy JOURNAL OF APPLIED PHYSICS, 109 (8). ? - ?. ISSN 0021-8979
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Official URL: http://dx.doi.org/10.1063/1.3575181
| Item Type: | Article |
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| Additional Information: | Copyright 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics, 109 (8) 083534 and may be found at I. F. Crowe et al., J. Appl. Phys. 109, 083534 (2011) |
| Uncontrolled Keywords: | Science & Technology, Physical Sciences, Physics, Applied, Physics, RAMAN-SPECTROSCOPY, THIN-FILMS, MICROCRYSTALLINE SILICON, VOLUME FRACTION, POROUS SILICON, TENSION, SCATTERING, SPECTRA, SIO2, NANOPARTICLES |
| Divisions: | Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre |
| Related URLs: | |
| ID Code: | 7825 |
| Deposited By: | Symplectic Elements |
| Deposited On: | 01 Dec 2011 11:31 |
| Last Modified: | 30 Mar 2013 14:45 |
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