Probing the phonon confinement in ultrasmall silicon nanocrystals reveals a size-dependent surface energy
Crowe, IF, Halsall, MP, Hulko, O, Knights, AP, Gwilliam, RM, Wojdak, M and Kenyon, AJ (2011) Probing the phonon confinement in ultrasmall silicon nanocrystals reveals a size-dependent surface energy JOURNAL OF APPLIED PHYSICS, 109 (8), ARTN 0.
Gwilliam_Probing the phonon confinement in ultrasmall silicon nanocrystals reveals.pdf - Version of Record
|Divisions :||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre|
|Date :||15 April 2011|
|Identification Number :||https://doi.org/10.1063/1.3575181|
|Uncontrolled Keywords :||Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, RAMAN-SPECTROSCOPY, THIN-FILMS, MICROCRYSTALLINE SILICON, VOLUME FRACTION, POROUS SILICON, TENSION, SCATTERING, SPECTRA, SIO2, NANOPARTICLES|
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|Additional Information :||
Copyright 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
The following article appeared in Journal of Applied Physics, 109 (8) 083534 and may be found at I. F. Crowe et al., J. Appl. Phys. 109, 083534 (2011)
|Depositing User :||Symplectic Elements|
|Date Deposited :||01 Dec 2011 11:31|
|Last Modified :||15 Feb 2015 14:35|
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