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Electrical characteristics and fast neutron response of semi-insulating bulk silicon carbide

Bryant, PA, Lohstroh, A and Sellin, PJ (2013) Electrical characteristics and fast neutron response of semi-insulating bulk silicon carbide IEEE Transactions on Nuclear Science, 60 (2). pp. 1432-1435.

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Abstract

The electrical characteristics and fast neutron response of a High Temperature Chemical Vapour Deposition (HTCVD) grown semi-insulating bulk SiC wafer has been measured. Current - Voltage measurements demonstrated a low leakage current in the region of 10 to 10 A with a bulk resistivity of at least 10 - 10 Ω.cm. Alpha particle spectroscopy measurements demonstrated an electron charge collection efficiency of up to 90% with reasonable reproducibility of the acquired spectra. Evidence of (incident particle) rate dependent polarisation was seen following a constant applied bias combined with alpha irradiation over a period of time (order of tens of minutes). The ability of the wafer to detect fast neutrons was demonstrated and a comparison drawn with the MCNPX simulated response of a bulk SiC device. Comparing the MCNPX simulated response of a bulk SiC device to that of a silicon device suggests a superior ability to detect fast neutrons with an intrinsic efficiency 1.7 times that of silicon. © 1963-2012 IEEE.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Physics
Authors :
AuthorsEmailORCID
Bryant, PAUNSPECIFIEDUNSPECIFIED
Lohstroh, AUNSPECIFIEDUNSPECIFIED
Sellin, PJUNSPECIFIEDUNSPECIFIED
Date : 2013
Identification Number : 10.1109/TNS.2013.2243753
Additional Information : © 2013 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Depositing User : Symplectic Elements
Date Deposited : 25 Jun 2013 09:36
Last Modified : 23 Sep 2013 20:08
URI: http://epubs.surrey.ac.uk/id/eprint/773786

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