Quantifying clustering in disordered carbon thin films

Carey, JD (2006) Quantifying clustering in disordered carbon thin films In: 33rd International Conference on Metallurgical Coatings and Thin Films, 2006-05-01 - 2006-05-05, San Diego, CA.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Divisions :	Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre
Authors :	Carey, JD
Date :	25 November 2006
DOI :	10.1016/j.tsf.2006.07.078
Contributors :	Contribution Name Email ORCID http://www.loc.gov/loc.terms/relators/PBL ELSEVIER SCIENCE SA,
Uncontrolled Keywords :	Science & Technology, Technology, Physical Sciences, Materials Science, Multidisciplinary, Materials Science, Coatings & Films, Physics, Applied, Physics, Condensed Matter, Materials Science, Physics, MATERIALS SCIENCE, COATINGS & FILMS, MATERIALS SCIENCE, MULTIDISCIPLINARY, PHYSICS, APPLIED, PHYSICS, CONDENSED MATTER, amorphous carbon, Raman, spin resonance, delocalization, HYDROGENATED AMORPHOUS-CARBON
Related URLs :	Author
Additional Information :	NOTICE: this is the author’s version of a work that was accepted for publication in Thin Solid Films. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Thin Solid Films, 515, November 2006, DOI 10.1016/j.tsf.2006.07.078.
Depositing User :	Symplectic Elements
Date Deposited :	08 Dec 2011 13:48
Last Modified :	31 Oct 2017 14:12
URI:	http://epubs.surrey.ac.uk/id/eprint/7687

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