Quantifying clustering in disordered carbon thin films
Carey, JD (2006) Quantifying clustering in disordered carbon thin films In: 33rd International Conference on Metallurgical Coatings and Thin Films, 2006-05-01 - 2006-05-05, San Diego, CA.
Thin Solid Films 515, 996 (2006).pdf - Accepted Version
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|Item Type:||Conference or Workshop Item (UNSPECIFIED)|
|Additional Information:||NOTICE: this is the author’s version of a work that was accepted for publication in Thin Solid Films. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Thin Solid Films, 515, November 2006, DOI 10.1016/j.tsf.2006.07.078.|
|Uncontrolled Keywords:||Science & Technology, Technology, Physical Sciences, Materials Science, Multidisciplinary, Materials Science, Coatings & Films, Physics, Applied, Physics, Condensed Matter, Materials Science, Physics, MATERIALS SCIENCE, COATINGS & FILMS, MATERIALS SCIENCE, MULTIDISCIPLINARY, PHYSICS, APPLIED, PHYSICS, CONDENSED MATTER, amorphous carbon, Raman, spin resonance, delocalization, HYDROGENATED AMORPHOUS-CARBON|
|Divisions:||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre|
|Depositing User:||Symplectic Elements|
|Date Deposited:||08 Dec 2011 13:48|
|Last Modified:||09 Jun 2014 13:23|
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