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Energy loss spectroscopic profiling across linear interfaces: The example of amorphous carbon superlattices

Stolojan, V, Moreau, P, Henley, SJ, Goringe, MJ and Silva, SRP (2006) Energy loss spectroscopic profiling across linear interfaces: The example of amorphous carbon superlattices ULTRAMICROSCOPY, 106 (4-5). pp. 346-355.

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Energy loss spectroscopic profiling is a way to acquire, in parallel, spectroscopic information across a linear feature of interest, using a Gatan imaging filter (GIF) fitted to a transmission electron microscope (TEM). This technique is capable of translating the high spatial resolution of a bright field image into a sampling of the spectral information with similar resolution. Here we evaluate the contributions of chromatic aberration and the various acquisition parameters to the spatial sampling resolution of the spectral information, and show that this can reach 0.5 nm, in a system not ordinarily capable of forming electron probes smaller than 2 nm. We use this high spatial sampling resolution to study the plasmon energy variation across amorphous carbon superlattices, in order to extract information about their structure and electronic properties. By modelling the interaction of the relativistic incident electrons with a dielectric layer sandwiched between outer layers, we show that, due to the screening of the interfaces and at increased collection angles, the plasmon energy in the sandwiched layer can still be identified for layer thicknesses down to 5 A. This allows us to measure the change in the well bandgap as a function of well width and to interpret it in terms of the changes in the sp2 -fractions due to the deposition method, as measured from the carbon K-edges, and in terms of quantum confinement of the well wavefunction by the adjacent barriers.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre
Authors :
Stolojan, V
Moreau, P
Henley, SJ
Goringe, MJ
Silva, SRP
Date : 1 March 2006
DOI : 10.1016/j.ultramic.2005.11.004
Uncontrolled Keywords : Science & Technology, Technology, Microscopy, EELS, ELSP, dielectric interface, amorphous carbon superlattice, localization inelastic scattering, TRANSMISSION ELECTRON-MICROSCOPY, FRESNEL CONTRAST ANALYSIS, INELASTIC-SCATTERING, DIELECTRIC LAYERS, THIN-FILMS, RESOLUTION, PLASMON, EXCITATIONS, PARTICLES, DIFFUSION
Additional Information : NOTICE: this is the author’s version of a work that was accepted for publication in ULTRAMICROSCOPY. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in ULTRAMICROSCOPY, 106(4-5), March 2006, DOI
Depositing User : Symplectic Elements
Date Deposited : 04 Feb 2013 12:17
Last Modified : 31 Oct 2017 14:58

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