Simultaneous depth profiling of the C-12 and C-13 elements in different samples using (d,p) reactions
Colaux, J and Terwagne, G (2005) Simultaneous depth profiling of the C-12 and C-13 elements in different samples using (d,p) reactions NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 240 (1-2). pp. 429-433.
Simultaneous depth profiling of 12C and 13C using (d,p) reactions.pdf
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Nuclear reactions (d,p) are often used to perform depth profiling of light elements in solids. In particular, protons coming from C-12(d,p(0)) C-13 and C-13(d,p(0)) C-14 reactions are emitted at very different energies. Consequently these two reactions can be used to depth profile C-12 and C-13 simultaneously. Nevertheless the cross-section of C-13(d,p(0)) C-14 reaction is 10 times smaller than the C-12(d,p(0)) C-13 one. So, the geometry of detection must be judiciously chosen in order to depth profile these two elements with a high sensitivity and good resolution. In the framework of this study we have performed 400 keV C-13 ions implantation into polished copper substrates at different temperatures and implanted doses with a 2 MV Tandem accelerator. Using the reactions described above, we have studied the evolution of C-13 depth profile as a function of implanted doses and temperature. We have also determined the origin of surface contamination that appears during the implantation process.
|Divisions :||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre|
|Date :||October 2005|
|Identification Number :||10.1016/j.nimb.2005.06.140|
|Additional Information :||NOTICE: this is the author’s version of a work that was accepted for publication in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 240(1-2), October 2005, DOI 10.1016/j.nimb.2005.06.140.|
|Depositing User :||Symplectic Elements|
|Date Deposited :||20 Mar 2013 15:07|
|Last Modified :||23 Sep 2013 19:58|
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