XPS and NRA depth profiling of nitrogen and carbon simultaneously implanted into copper to synthesize CN like compounds
Colaux, JL, Terwagne, G and Louette, P (2009) XPS and NRA depth profiling of nitrogen and carbon simultaneously implanted into copper to synthesize CN like compounds Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 267 (8-9). pp. 1299-1302.
XPS & NRA depth profiling of N & C.pdf
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Carbon nitride nano-compounds have been synthesized into copper by simultaneous high fluence (10 at. cm) implantation of C and N ions. The implantations were performed with a 2 MV Tandem accelerator. The terminal voltage was fixed at 400 kV and the target temperature was maintained at 250 °C during the process. Depth profiling of C and N has been performed using (d,p) and (d,α) nuclear reactions induced by a 1.05 MeV deuteron beam. The retained dose deduced from NRA measurement is relatively close to the implanted one, which indicates that carbon and nitrogen diffusion processes were likely limited during implantation. The chemical bonds between carbon and nitrogen were studied as a function of depth by X-ray photoelectron spectroscopy (XPS). The C 1s and N 1s core level photoelectron spectra revealed the presence of different types of C-N bonds, which correspond to specific kinds of chemical states. These results indicate that different carbon nitride compounds have been formed during the implantation. © 2009 Elsevier B.V. All rights reserved.
|Divisions :||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre|
|Date :||1 May 2009|
|Identification Number :||https://doi.org/10.1016/j.nimb.2009.01.037|
|Additional Information :||NOTICE: this is the author’s version of a work that was accepted for publication in uclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in uclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 267(8-9), May 2009, DOI 10.1016/j.nimb.2009.01.037.|
|Depositing User :||Symplectic Elements|
|Date Deposited :||22 Feb 2013 11:22|
|Last Modified :||23 Sep 2013 19:58|
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