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Study of carbon nitride compounds synthesised by co-implantation of C and N in copper at different temperatures

Colaux, JL, Terwagne, G, Louette, P, Colomer, J-F, Edmondson, PD and Donnelly, SE (2011) Study of carbon nitride compounds synthesised by co-implantation of C and N in copper at different temperatures Materials Chemistry and Physics, 126 (1-2). pp. 337-343.

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Carbon nitride compounds have been synthesised in copper by simultaneous high fluence (10 at. cm) implantation of C and N ions. During the implantation process, the substrate temperature was maintained at 25, 250, 350 or 450 °C. Depth profiles of C and N were determined using the non-resonant nuclear reactions (NRA) induced by a 1.05 MeV deuteron beam. The retained doses were deduced from NRA measurements and compared to the implanted fluence. The chemical bonds between carbon and nitrogen were studied as a function of depth and temperature by X-ray photoelectron spectroscopy (XPS). The curve fitting of C 1s and N 1s core level photoelectron spectra reveal different types of C-N bonds and show the signature of N molecules. The presence of nitrogen gas bubbles in copper was highlighted by mass spectroscopy. The structure of carbon nitride compounds was characterised by transmission electron microscopy (TEM). For that purpose, cross-sectional samples were prepared using a focused ion beam (FIB) system. TEM observations showed the presence of small amorphous carbon nitride "nano-capsules" and large gas bubbles in copper. Based on our observations, we propose a model for the growth of these nano-objects. Finally, the mechanical properties of the implanted samples were investigated by nano-indentation. © 2010 Elsevier B.V. All rights reserved.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Authors :
Colaux, JL
Terwagne, G
Louette, P
Colomer, J-F
Edmondson, PD
Donnelly, SE
Date : 15 March 2011
DOI : 10.1016/j.matchemphys.2010.11.016
Additional Information : NOTICE: this is the author’s version of a work that was accepted for publication in Materials Chemistry and Physics. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Materials Chemistry and Physics, 126(1-2), March 2011, DOI 10.1016/j.matchemphys.2010.11.016 .
Depositing User : Symplectic Elements
Date Deposited : 22 Feb 2013 10:31
Last Modified : 31 Oct 2017 14:56

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