Conditioning of hydrogenated amorphous carbon thin films for field emission via current stressing
Carey, JD and Silva, SRP (2001) Conditioning of hydrogenated amorphous carbon thin films for field emission via current stressing APPLIED PHYSICS LETTERS, 78 (3). pp. 347-349.
Available under License : See the attached licence file.
The effects of electrical current stressing on the field emission characteristics of hydrogenated amorphous carbon (a-C:H) thin films are reported. In these a-C:H films an initial conditioning treatment of the film is often required before the onset of stable emission and only after several voltage cycles do the values of the threshold field tend to converge. By stressing of the film by applying a predetermined current through the film, the initial conditioning treatment can be removed and stable and reproducible emission observed. Retesting of the current stressed films shows that the films remain fully conditioned provided a sufficiently high stress current was initially used.
|Divisions :||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre|
|Date :||15 January 2001|
|Identification Number :||https://doi.org/10.1063/1.1339999|
|Uncontrolled Keywords :||Science & Technology, Physical Sciences, Physics, Applied, Physics, DIAMOND-LIKE CARBON, ELECTRON-EMISSION|
|Related URLs :|
|Additional Information :||
Copyright 2001 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
The following article appeared in Applied Physics Letters, 78 (3) and may be found at http://dx.doi.org/10.1063/1.1339999
|Depositing User :||Mr Adam Field|
|Date Deposited :||28 Jan 2013 10:56|
|Last Modified :||09 Jun 2014 13:27|
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