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Quantifying Clustering in Disordered Carbon Thin Films

Carey, JD (2006) Quantifying Clustering in Disordered Carbon Thin Films Thin Solid Films, 515 (3). pp. 996-999.

Thin Solid Films 515, 996 (2006).pdf
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The quantification of disorder and the effects of clustering in the sp2 phase of amorphous carbon thin films are discussed. The sp2 phase is described in terms of disordered nanometer sized conductive sp2 clusters embedded in a less conductive sp3 matrix. Quantification of the clustering of the sp2 phase is estimated from optical as well as from electron and nuclear magnetic resonance methods. Unlike in other disordered group IV thin film semiconductors, we show that care must be exercised in attributing a meaning to the Urbach energy extracted from absorption measurements in the disordered carbon system. The influence of structural disorder, associated with sp2 clusters of similar size, and topological disorder due to undistorted clusters of different sizes is also discussed. Extensions of this description to other systems are also presented.

Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre
Authors :
Date : 26 November 2006
Identification Number : 10.1016/j.tsf.2006.07.078
Uncontrolled Keywords : amorphous carbon, sp2 phase
Related URLs :
Additional Information : NOTICE: this is the author’s version of a work that was accepted for publication in Thin Solid Films. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Thin Solid Films, 515(3), November 2006, DOI 10.1016/j.tsf.2006.07.078.
Depositing User : Symplectic Elements
Date Deposited : 14 Jan 2013 10:21
Last Modified : 09 Jun 2014 13:13

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