In situ electrode manipulation for three terminal field emission characterization of individual carbon nanotubes
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Smith, RC, Carey, JD, Cox, DC and Silva, SRP (2006) In situ electrode manipulation for three terminal field emission characterization of individual carbon nanotubes APPLIED PHYSICS LETTERS, 89 (6). . ISSN 0003-6951
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Official URL: http://dx.doi.org/10.1063/1.2335604
Abstract
In situ three terminal electron field emission characterization of an isolated multiwalled carbon nanotube has been performed, where both anode and gate electrodes are attached to high precision piezodrivers. All measurements are performed in a scanning electron microscope allowing accurate knowledge of the local environment of the nanotube to be obtained. It is shown that the presence of the grounded gate electrode screens the applied field by approximately 32%. This technique in positioning the gate and anode electrodes allows for an estimate of the gate transparency factor and demonstrates characterization of individual carbon nanotubes without the need for fabrication of arrays of emitters.
| Item Type: | Article |
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| Additional Information: | Copyright 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 89 (6) and may be found at http://dx.doi.org/10.1063/1.2335604 |
| Uncontrolled Keywords: | Science & Technology, Physical Sciences, Physics, Applied, Physics, EMITTERS, FILMS, in-situ electrical characterisation, single carbon nanotube electronics, nanomanipulation and FIB |
| Divisions: | Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre |
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| ID Code: | 742482 |
| Deposited By: | Mr Adam Field |
| Deposited On: | 13 Dec 2012 13:25 |
| Last Modified: | 28 Jan 2013 10:13 |
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