Structure of multi-oxygen-related defects in erbium-implanted silicon
Tools
Carey, JD (2002) Structure of multi-oxygen-related defects in erbium-implanted silicon JOURNAL OF PHYSICS-CONDENSED MATTER, 14 (36), PII S0. pp. 8537-8547.
![]() |
Text (deleted)
JPhys CM 14, 8537 (2002).pdf Restricted to Repository staff only Available under License : See the attached licence file. Download (188kB) |
|
![]()
|
Text (licence)
SRI_deposit_agreement.pdf Download (33kB) |
|
![]()
|
Text
JPhys CM 14, 8537 (2002).pdf Available under License : See the attached licence file. Download (734kB) |
Official URL: http://dx.doi.org/10.1088/0953-8984/14/36/310
Item Type: | Article | ||||||
---|---|---|---|---|---|---|---|
Divisions : | Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute | ||||||
Authors : |
|
||||||
Date : | 15 September 2002 | ||||||
DOI : | 10.1088/0953-8984/14/36/310 | ||||||
Uncontrolled Keywords : | Science & Technology, Physical Sciences, Physics, Condensed Matter, Physics, ELECTRON-PARAMAGNETIC-RESONANCE, CRYSTALLINE SILICON, INTERSTITIAL OXYGEN, DOPED SILICON, SI, ER, IDENTIFICATION, COMPLEXES | ||||||
Related URLs : | |||||||
Additional Information : | Copyright 2002 Institute of Physics. This is the author's accepted manuscript. | ||||||
Depositing User : | Symplectic Elements | ||||||
Date Deposited : | 14 Dec 2012 10:06 | ||||||
Last Modified : | 31 Oct 2017 14:54 | ||||||
URI: | http://epubs.surrey.ac.uk/id/eprint/742163 |
Actions (login required)
![]() |
View Item |
Downloads
Downloads per month over past year