Di-carbon defects in annealed highly carbon doped GaAs

Wagner, J, Newman, RC, Davidson, BR, Westwater, SP, Bullough, TJ, Joyce, TB, Latham, CD, Jones, R and Öberg, S (1997) Di-carbon defects in annealed highly carbon doped GaAs Physical Review Letters, 78 (1). pp. 74-77.

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Abstract

Formation of bonded dicarbon C-C centers is deduced from the observation of Raman lines at 1742, 1708, and 1674 cm-1 in GaAs codoped with 12C and 13C after annealing at 850 °C with concomitant loss of vibrational scattering from CAs. The frequencies agree with results of ab initio theory for a C-C split interstitial (deep donor) formed by the trapping of a mobile interstitial C (displaced CAs) atom by an undisplaced CAs acceptor. Other mechanisms of carrier loss are inferred since a weaker Raman triplet is detected at 1859, 1824, and 1788 cm-1 from a different C-C complex.

Item Type:	Article
Divisions :	Faculty of Engineering and Physical Sciences > Chemistry
Authors :	Authors Email ORCID Wagner, J UNSPECIFIED UNSPECIFIED Newman, RC UNSPECIFIED UNSPECIFIED Davidson, BR UNSPECIFIED UNSPECIFIED Westwater, SP UNSPECIFIED UNSPECIFIED Bullough, TJ UNSPECIFIED UNSPECIFIED Joyce, TB UNSPECIFIED UNSPECIFIED Latham, CD UNSPECIFIED UNSPECIFIED Jones, R UNSPECIFIED UNSPECIFIED Öberg, S UNSPECIFIED UNSPECIFIED
Date :	6 January 1997
Identification Number :	https://doi.org/10.1103/PhysRevLett.78.74
Related URLs :	Publisher
Additional Information :	Copyright 1997 The American Physical Society.
Depositing User :	Symplectic Elements
Date Deposited :	14 Dec 2012 12:43
Last Modified :	23 Sep 2013 19:54
URI:	http://epubs.surrey.ac.uk/id/eprint/741011

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