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Electron beam quality control using an amorphous silicon EPID

Beck, JA, Budgell, GJ, Roberts, DA and Evans, PM (2009) Electron beam quality control using an amorphous silicon EPID MEDICAL PHYSICS, 36 (5). pp. 1859-1866.

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Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Centre for Vision Speech and Signal Processing
Authors :
AuthorsEmailORCID
Beck, JAUNSPECIFIEDUNSPECIFIED
Budgell, GJUNSPECIFIEDUNSPECIFIED
Roberts, DAUNSPECIFIEDUNSPECIFIED
Evans, PMUNSPECIFIEDUNSPECIFIED
Date : May 2009
Identification Number : 10.1118/1.3110671
Uncontrolled Keywords : amorphous semiconductors, biomedical equipment, biomedical imaging, electron beams, linear accelerators, quality control, radiation therapy, silicon radiation detectors
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 05 Mar 2013 10:07
Last Modified : 23 Sep 2013 19:53
URI: http://epubs.surrey.ac.uk/id/eprint/738900

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