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Focused ion beam/scanning electron microscopy characterization of cell behavior on polymer micro-/nanopatterned substrates: A study of cell-substrate interactions

Martinez, E, Engel, E, Lopez-Iglesias, C, Mills, CA, Planell, JA and Samitier, J (2008) Focused ion beam/scanning electron microscopy characterization of cell behavior on polymer micro-/nanopatterned substrates: A study of cell-substrate interactions MICRON, 39 (2). pp. 111-116.

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Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute
Authors :
AuthorsEmailORCID
Martinez, EUNSPECIFIEDUNSPECIFIED
Engel, EUNSPECIFIEDUNSPECIFIED
Lopez-Iglesias, CUNSPECIFIEDUNSPECIFIED
Mills, CAUNSPECIFIEDUNSPECIFIED
Planell, JAUNSPECIFIEDUNSPECIFIED
Samitier, JUNSPECIFIEDUNSPECIFIED
Date : 1 January 2008
Identification Number : 10.1016/j.micron.2006.12.003
Uncontrolled Keywords : Science & Technology, Technology, Microscopy, MICROSCOPY, electron microscopy, interface, nanotopography, osteoblast, adhesion molecule, cell morphology, MORPHOLOGY, SURFACES, TITANIUM, FEATURES, IMPRINT, SYSTEM
Related URLs :
Additional Information : NOTICE: this is the author’s version of a work that was accepted for publication in Micron. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Micron, 39(2), January 2008, DOI 10.1016/j.micron.2006.12.003 .
Depositing User : Symplectic Elements
Date Deposited : 11 Jan 2013 09:52
Last Modified : 12 Feb 2015 02:37
URI: http://epubs.surrey.ac.uk/id/eprint/738153

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