Focused ion beam/scanning electron microscopy characterization of cell behavior on polymer micro-/nanopatterned substrates: A study of cell-substrate interactions
Martinez, E, Engel, E, Lopez-Iglesias, C, Mills, CA, Planell, JA and Samitier, J (2008) Focused ion beam/scanning electron microscopy characterization of cell behavior on polymer micro-/nanopatterned substrates: A study of cell-substrate interactions MICRON, 39 (2). pp. 111-116.
Micron Martinez Focused ion beam.pdf
Available under License : See the attached licence file.
|Divisions :||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute|
|Date :||1 January 2008|
|Identification Number :||https://doi.org/10.1016/j.micron.2006.12.003|
|Uncontrolled Keywords :||Science & Technology, Technology, Microscopy, MICROSCOPY, electron microscopy, interface, nanotopography, osteoblast, adhesion molecule, cell morphology, MORPHOLOGY, SURFACES, TITANIUM, FEATURES, IMPRINT, SYSTEM|
|Related URLs :|
|Additional Information :||NOTICE: this is the author’s version of a work that was accepted for publication in Micron. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Micron, 39(2), January 2008, DOI 10.1016/j.micron.2006.12.003 .|
|Depositing User :||Symplectic Elements|
|Date Deposited :||11 Jan 2013 09:52|
|Last Modified :||12 Feb 2015 02:37|
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