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ToF-SIMS depth profiling of a complex polymeric coating employing a C-60 sputter source

Hinder, SJ, Lowe, C and Watts, JF (2007) ToF-SIMS depth profiling of a complex polymeric coating employing a C-60 sputter source SURFACE AND INTERFACE ANALYSIS, 39 (6). 467 - 475. ISSN 0142-2421

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Item Type: Article
Additional Information: The definitive version is available at http://onlinelibrary.wiley.com/doi/10.1002/sia.2546/abstract;jsessionid=7A6C601B232E98505B306017C5EF848A.d04t02
Uncontrolled Keywords: Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, time-of-flight secondary ion mass spectrometry, depth profiling, C-60, coil coatings, polymer, ION MASS-SPECTROMETRY, HIGH-RESOLUTION XPS, BUCKMINSTERFULLERENE PROBE, ORGANIC MATERIALS, STATIC SIMS, FILMS, BOMBARDMENT, PROJECTILES, BEAM, AG
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Divisions: Faculty of Engineering and Physical Sciences > Mechanical Engineering Sciences
Depositing User: Symplectic Elements
Date Deposited: 16 Nov 2012 09:35
Last Modified: 09 Jun 2014 13:14
URI: http://epubs.surrey.ac.uk/id/eprint/738090

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