An XPS and ToF-SIMS investigation of the outermost nanometres of a poly(vinylidene difluoride) coating
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Hinder, SJ, Lowe, C and Watts, JF (2007) An XPS and ToF-SIMS investigation of the outermost nanometres of a poly(vinylidene difluoride) coating PROGRESS IN ORGANIC COATINGS, 60 (3). pp. 255-261.
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Official URL: http://www.sciencedirect.com/science/article/pii/S...
Item Type: | Article | ||||||||||||
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Divisions : | Faculty of Engineering and Physical Sciences > Mechanical Engineering Sciences | ||||||||||||
Authors : |
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Date : | 1 October 2007 | ||||||||||||
DOI : | 10.1016/j.porgcoat.2007.07.016 | ||||||||||||
Uncontrolled Keywords : | Science & Technology, Physical Sciences, Technology, Chemistry, Applied, Materials Science, Coatings & Films, Chemistry, Materials Science, CHEMISTRY, APPLIED, MATERIALS SCIENCE, COATINGS & FILMS, time-of-flight secondary ion mass spectrometry, X-ray photoelectron spectroscopy, PVdF coating, depth profiling, C-60, polymer, ION MASS-SPECTROMETRY, RAY PHOTOELECTRON-SPECTROSCOPY, HIGH-RESOLUTION XPS, BUCKMINSTERFULLERENE PROBE, SEGREGATION PHENOMENA, COPOLYMER BLENDS, SURFACE, FILMS, FLUORIDE), POLYMER | ||||||||||||
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Additional Information : | NOTICE: this is the author’s version of a work that was accepted for publication in Progress in Organic Coatings. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Progress in Organic Coatings, 60(3), October 2007, DOI 10.1016/j.porgcoat.2007.07.016 | ||||||||||||
Depositing User : | Symplectic Elements | ||||||||||||
Date Deposited : | 16 Nov 2012 11:18 | ||||||||||||
Last Modified : | 31 Oct 2017 14:51 | ||||||||||||
URI: | http://epubs.surrey.ac.uk/id/eprint/738081 |
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