An XPS and ToF-SIMS investigation of the outermost nanometres of a poly(vinylidene difluoride) coating

Hinder, SJ, Lowe, C and Watts, JF (2007) An XPS and ToF-SIMS investigation of the outermost nanometres of a poly(vinylidene difluoride) coating PROGRESS IN ORGANIC COATINGS, 60 (3). pp. 255-261.

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Item Type:	Article
Divisions :	Faculty of Engineering and Physical Sciences > Mechanical Engineering Sciences
Authors :	Authors Email ORCID Hinder, SJ UNSPECIFIED UNSPECIFIED Lowe, C UNSPECIFIED UNSPECIFIED Watts, JF UNSPECIFIED UNSPECIFIED
Date :	1 October 2007
Identification Number :	https://doi.org/10.1016/j.porgcoat.2007.07.016
Uncontrolled Keywords :	Science & Technology, Physical Sciences, Technology, Chemistry, Applied, Materials Science, Coatings & Films, Chemistry, Materials Science, CHEMISTRY, APPLIED, MATERIALS SCIENCE, COATINGS & FILMS, time-of-flight secondary ion mass spectrometry, X-ray photoelectron spectroscopy, PVdF coating, depth profiling, C-60, polymer, ION MASS-SPECTROMETRY, RAY PHOTOELECTRON-SPECTROSCOPY, HIGH-RESOLUTION XPS, BUCKMINSTERFULLERENE PROBE, SEGREGATION PHENOMENA, COPOLYMER BLENDS, SURFACE, FILMS, FLUORIDE), POLYMER
Related URLs :	Author
Additional Information :	NOTICE: this is the author’s version of a work that was accepted for publication in Progress in Organic Coatings. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Progress in Organic Coatings, 60(3), October 2007, DOI 10.1016/j.porgcoat.2007.07.016
Depositing User :	Symplectic Elements
Date Deposited :	16 Nov 2012 11:18
Last Modified :	17 Jan 2015 14:57
URI:	http://epubs.surrey.ac.uk/id/eprint/738081

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