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Current percolation in ultrathin channel nanocrystalline silicon transistors

Guo, X, Silva, SRP and Ishii, T (2008) Current percolation in ultrathin channel nanocrystalline silicon transistors APPLIED PHYSICS LETTERS, 93 (4), ARTN 0.

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Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre
Authors :
Guo, X
Silva, SRP
Ishii, T
Date : 28 July 2008
DOI : 10.1063/1.2965807
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, CONDUCTION, MEMORY, FILM
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Additional Information :

Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

The following article appeared in Applied Physics Letters, 93 (4) 042105 and may be found at X. Guo, ,T. Ishii & S. R. P. Silva, Appl. Phys.Lett. 93, 042105 (2008)

Depositing User : Mr Adam Field
Date Deposited : 26 Nov 2012 10:01
Last Modified : 31 Oct 2017 14:50

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