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Modulation speed resonant-cavity and leakage current in 650 nm light emitting diodes

Hild, K, Sale, TE, Sweeney, SJ, Hirotani, M, Mizuno, Y and Kato, T (2004) Modulation speed resonant-cavity and leakage current in 650 nm light emitting diodes IEE PROCEEDINGS-OPTOELECTRONICS, 151 (2). pp. 94-97.

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Abstract

The authors have investigated red-emitting (650 nm) resonant-cavity light emitting diodes for use with polymer optical fibres. The small signal modulation response is characterised by a single order roll-off. The -3 dB bandwidth is found to be determined solely by the differential carrier lifetime, T, in the active region and hence dependent on current density, J, alone with no intrinsic size effects. The tau(J) relation allows the calculation of the active region carrier density and hence the recombination parameters (mono- and bimolecular) in the regime where the leakage is small. It is shown that the leakage is insignificant for currents below 200 A/cm(2) at 20degreesC. Above 40degreesC the leakage rises rapidly with temperature, and is evident from a dramatic fall in tau and an accelerated rise in the current required to maintain constant light output.

Item Type: Article
Authors :
AuthorsEmailORCID
Hild, KUNSPECIFIEDUNSPECIFIED
Sale, TEUNSPECIFIEDUNSPECIFIED
Sweeney, SJUNSPECIFIEDUNSPECIFIED
Hirotani, MUNSPECIFIEDUNSPECIFIED
Mizuno, YUNSPECIFIEDUNSPECIFIED
Kato, TUNSPECIFIEDUNSPECIFIED
Date : April 2004
Identification Number : https://doi.org/10.1049/ip-opt:20040289
Depositing User : Symplectic Elements
Date Deposited : 28 Mar 2017 14:11
Last Modified : 28 Mar 2017 14:11
URI: http://epubs.surrey.ac.uk/id/eprint/733510

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