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High temperature operation of 760 nm vertical-cavity surface-emitting lasers investigated using photomodulated reflectance wafer measurements and temperature-dependent device studies

Cripps, SA, Hosea, TJC, Sweeney, SJ, Lock, D, Leinonen, T, Lyytikainen, J and Dumitrescu, M (2005) High temperature operation of 760 nm vertical-cavity surface-emitting lasers investigated using photomodulated reflectance wafer measurements and temperature-dependent device studies IEE PROCEEDINGS-OPTOELECTRONICS, 152 (2). pp. 103-109.

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Item Type: Article
Authors :
NameEmailORCID
Cripps, SAUNSPECIFIEDUNSPECIFIED
Hosea, TJCUNSPECIFIEDUNSPECIFIED
Sweeney, SJUNSPECIFIEDUNSPECIFIED
Lock, DUNSPECIFIEDUNSPECIFIED
Leinonen, TUNSPECIFIEDUNSPECIFIED
Lyytikainen, JUNSPECIFIEDUNSPECIFIED
Dumitrescu, MUNSPECIFIEDUNSPECIFIED
Date : 1 April 2005
Identification Number : 10.1049/ip-opt:20045022
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Optics, Telecommunications, Engineering, MODULATION SPECTROSCOPY, QUANTUM-WELL
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 28 Mar 2017 14:11
Last Modified : 31 Oct 2017 14:49
URI: http://epubs.surrey.ac.uk/id/eprint/733506

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