Above Threshold Estimation of Alpha (Henry) Parameter in Stripe Lasers Using Near- and Far-Field Intensity Measurements
Pagano, R, Mukherjee, J, Sajewicz, P and Corbett, B (2011) Above Threshold Estimation of Alpha (Henry) Parameter in Stripe Lasers Using Near- and Far-Field Intensity Measurements IEEE JOURNAL OF QUANTUM ELECTRONICS, 47 (4). pp. 439-446.
Available under License : See the attached licence file.
|Divisions :||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute|
|Date :||1 April 2011|
|Identification Number :||https://doi.org/10.1109/JQE.2010.2091255|
|Uncontrolled Keywords :||Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Optics, Physics, Applied, Engineering, Physics, ENGINEERING, ELECTRICAL & ELECTRONIC, OPTICS, PHYSICS, APPLIED, Alpha parameter, anti-guiding, broad area lasers, gain guiding, gain profile, Henry parameter, phase extraction, stripe lasers, AREA SEMICONDUCTOR-LASERS, LATERAL-MODES, LINEWIDTH, GAIN, FILAMENTATION, SECTION|
|Related URLs :|
|Additional Information :||© 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.|
|Depositing User :||Symplectic Elements|
|Date Deposited :||04 Dec 2012 10:03|
|Last Modified :||17 Jan 2015 14:57|
Actions (login required)
Downloads per month over past year