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Above Threshold Estimation of Alpha (Henry) Parameter in Stripe Lasers Using Near- and Far-Field Intensity Measurements

Pagano, R, Mukherjee, J, Sajewicz, P and Corbett, B (2011) Above Threshold Estimation of Alpha (Henry) Parameter in Stripe Lasers Using Near- and Far-Field Intensity Measurements IEEE JOURNAL OF QUANTUM ELECTRONICS, 47 (4). 439 - 446. ISSN 0018-9197

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Item Type: Article
Additional Information: © 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Uncontrolled Keywords: Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Optics, Physics, Applied, Engineering, Physics, ENGINEERING, ELECTRICAL & ELECTRONIC, OPTICS, PHYSICS, APPLIED, Alpha parameter, anti-guiding, broad area lasers, gain guiding, gain profile, Henry parameter, phase extraction, stripe lasers, AREA SEMICONDUCTOR-LASERS, LATERAL-MODES, LINEWIDTH, GAIN, FILAMENTATION, SECTION
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Divisions: Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute
Depositing User: Symplectic Elements
Date Deposited: 04 Dec 2012 10:03
Last Modified: 09 Jun 2014 13:14
URI: http://epubs.surrey.ac.uk/id/eprint/733392

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