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Nanometer scale masked ion damage barriers in YBa2Cu3O7-delta

Kang, DJ, Speaks, R, Peng, NH, Webb, R, Jeynes, C, Booij, WE, Tarte, EJ, Moore, DF and Blamire, MG (2001) Nanometer scale masked ion damage barriers in YBa2Cu3O7-delta In: 2000 Applied Superconductivity Conference, 2000-09-17 - 2000-09-22, VIRGINIA BEACH, VIRGINIA.

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Item Type: Conference or Workshop Item (Conference Paper)
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Authors :
AuthorsEmailORCID
Kang, DJUNSPECIFIEDUNSPECIFIED
Speaks, RUNSPECIFIEDUNSPECIFIED
Peng, NHUNSPECIFIEDUNSPECIFIED
Webb, RUNSPECIFIEDUNSPECIFIED
Jeynes, CUNSPECIFIEDUNSPECIFIED
Booij, WEUNSPECIFIEDUNSPECIFIED
Tarte, EJUNSPECIFIEDUNSPECIFIED
Moore, DFUNSPECIFIEDUNSPECIFIED
Blamire, MGUNSPECIFIEDUNSPECIFIED
Date : 1 March 2001
Identification Number : 10.1109/77.919461
Contributors :
ContributionNameEmailORCID
PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Physics, Applied, Engineering, Physics, ENGINEERING, ELECTRICAL & ELECTRONIC, PHYSICS, APPLIED, superconducting devices, nanotechnology YBCO, SNS devices, SUPERCONDUCTOR JOSEPHSON-JUNCTIONS, ELECTRON, BEAM, IMPLANTATION
Related URLs :
Additional Information : © 2000 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Depositing User : Symplectic Elements
Date Deposited : 21 Dec 2012 10:17
Last Modified : 17 Jan 2015 14:56
URI: http://epubs.surrey.ac.uk/id/eprint/732932

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