Concentration dependence of the fluorescence decay profile in transition metal doped chalcogenide glass
Hughes, M, Hewak, DW and Curry, RJ (2007) Concentration dependence of the fluorescence decay profile in transition metal doped chalcogenide glass Proceedings of SPIE - The International Society for Optical Engineering, 6469. ISSN 0277-786X
Concentration dependence of the fluorescence decay profile in transition metal doped chalcogenide glass .pdf
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In this paper we present the fluorescence decay profiles of vanadium and titanium doped gallium lanthanum sulphide (GLS) glass at various doping concentrations between 0.01 and 1% (molar). We demonstrate that below a critical doping concentration the fluorescence decay profile can be fitted with the stretched exponential function: exp[-(t/τ)β, where τ is the fluorescence lifetime and β is the stretch factor. At low concentrations the lifetime for vanadium and titanium doped GLS was 30 μs and 67 μs respectively. We validate the use of the stretched exponential model and discuss the possible microscopic phenomenon it arises from. We also demonstrate that above a critical doping concentration of around 0.1% (molar) the fluorescence decay profile can be fitted with the double exponential function: a*exp-(t/τ )+ b*exp-(t/τ ), where τ and τ are characteristic fast and slow components of the fluorescence decay profile, for vanadium the fast and slow components are 5 us and 30 μs respectively and for titanium they are 15 μs and 67 μs respectively. We also show that the fluorescence lifetime of vanadium and titanium at low concentrations in the oxide rich host gallium lanthanum oxy-sulphide (GLSO) is 43 μs and 97 μs respectively, which is longer than that in GLS. From this we deduce that vanadium and titanium fluorescing ions preferentially substitute into high efficiency oxide sites until at a critical concentration they become saturated and low efficiency sulphide sites start to be filled.
|Divisions :||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute|
|Identification Number :||10.1117/12.699134|
|Additional Information :||Copyright 2011 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. M. Hughes ; D. W. Hewak and R. J. Curry "Concentration dependence of the fluorescence decay profile in transition metal doped chalcogenide glass", Proc. SPIE 6469, Optical Components and Materials IV, 64690D (February 20, 2007); doi:10.1117/12.699134;|
|Depositing User :||Symplectic Elements|
|Date Deposited :||13 Nov 2012 10:08|
|Last Modified :||09 Jun 2014 13:14|
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