Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam
Hao, L, Macfarlane, JC, Gallop, JC, Cox, D, Beyer, J, Drung, D and Schurig, T (2008) Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam APPLIED PHYSICS LETTERS, 92 (19), ARTN 1.
Measurement and noise performance of nano.pdf
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|Divisions :||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre|
|Date :||12 May 2008|
|Identification Number :||https://doi.org/10.1063/1.2917580|
|Uncontrolled Keywords :||Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, SQUIDS, MICROSCOPE|
|Related URLs :|
|Additional Information :||<p>Copyright 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.</p> <p>The following article appeared in Applied Physics Letters, 92 (19) 192507 and may be found at <DOI: 10.1063/1.2917580 >Hao L, Macfarlane JC, Gallop JC, Cox D, et al., Appl. Phys.Lett. 92, 192507 (2008)</A> </p>|
|Depositing User :||Symplectic Elements|
|Date Deposited :||16 Nov 2012 10:16|
|Last Modified :||09 May 2015 13:34|
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