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Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam

Hao, L, Macfarlane, JC, Gallop, JC, Cox, D, Beyer, J, Drung, D and Schurig, T (2008) Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam APPLIED PHYSICS LETTERS, 92 (19). ? - ?. ISSN 0003-6951

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Item Type: Article
Additional Information: <p>Copyright 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.</p> <p>The following article appeared in Applied Physics Letters, 92 (19) 192507 and may be found at <DOI: 10.1063/1.2917580 >Hao L, Macfarlane JC, Gallop JC, Cox D, et al., Appl. Phys.Lett. 92, 192507 (2008)</A> </p>
Uncontrolled Keywords: Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, SQUIDS, MICROSCOPE
Related URLs:
Divisions: Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre
Depositing User: Symplectic Elements
Date Deposited: 16 Nov 2012 10:16
Last Modified: 02 Nov 2014 14:34
URI: http://epubs.surrey.ac.uk/id/eprint/732872

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