Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam
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Hao, L, Macfarlane, JC, Gallop, JC, Cox, D, Beyer, J, Drung, D and Schurig, T (2008) Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam APPLIED PHYSICS LETTERS, 92 (19). ? - ?. ISSN 0003-6951
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Official URL: http://dx.doi.org/10.1063/1.2917580
| Item Type: | Article |
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| Additional Information: | <p>Copyright 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.</p> <p>The following article appeared in Applied Physics Letters, 92 (19) 192507 and may be found at <DOI: 10.1063/1.2917580 >Hao L, Macfarlane JC, Gallop JC, Cox D, et al., Appl. Phys.Lett. 92, 192507 (2008)</A> </p> |
| Uncontrolled Keywords: | Science & Technology, Physical Sciences, Physics, Applied, Physics, SQUIDS, MICROSCOPE |
| Divisions: | Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre |
| Related URLs: | |
| ID Code: | 732872 |
| Deposited By: | Symplectic Elements |
| Deposited On: | 16 Nov 2012 10:16 |
| Last Modified: | 16 Mar 2013 14:38 |
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