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Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam

Hao, L, Macfarlane, JC, Gallop, JC, Cox, D, Beyer, J, Drung, D and Schurig, T (2008) Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam APPLIED PHYSICS LETTERS, 92 (19). ? - ?. ISSN 0003-6951

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Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre
Authors :
AuthorsEmail
Hao, LUNSPECIFIED
Macfarlane, JCUNSPECIFIED
Gallop, JCUNSPECIFIED
Cox, DUNSPECIFIED
Beyer, JUNSPECIFIED
Drung, DUNSPECIFIED
Schurig, TUNSPECIFIED
Date : 12 May 2008
Identification Number : 10.1063/1.2917580
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, SQUIDS, MICROSCOPE
Related URLs :
Additional Information : <p>Copyright 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.</p> <p>The following article appeared in Applied Physics Letters, 92 (19) 192507 and may be found at <DOI: 10.1063/1.2917580 >Hao L, Macfarlane JC, Gallop JC, Cox D, et al., Appl. Phys.Lett. 92, 192507 (2008)</A> </p>
Depositing User : Symplectic Elements
Date Deposited : 16 Nov 2012 10:16
Last Modified : 09 May 2015 13:34
URI: http://epubs.surrey.ac.uk/id/eprint/732872

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