The influence of stray DC magnetic fields in MeV ion nanobeam systems
Merchant, MJ, Grime, GW and Palitsin, V (2010) The influence of stray DC magnetic fields in MeV ion nanobeam systems In: 19th International Conference on Ion Beam Analysis, 2009-09-07 - 2009-09-11, Univ Cambridge, Cambridge, ENGLAND.
Available under License : See the attached licence file.
|Item Type:||Conference or Workshop Item (Conference Paper)|
|Divisions :||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre|
|Date :||1 June 2010|
|Identification Number :||10.1016/j.nimb.2010.02.105|
|Uncontrolled Keywords :||Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, ATOMIC, MOLECULAR & CHEMICAL, PHYSICS, NUCLEAR, Nuclear microbeams, Beam optics, Quadrupole lens, NUCLEAR MICROPROBE|
|Related URLs :|
|Additional Information :||NOTICE: this is the preprint of a work that was accepted for publication in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 268, June 2010, DOI 10.1016/j.nimb.2010.02.105.|
|Depositing User :||Symplectic Elements|
|Date Deposited :||11 Dec 2012 12:48|
|Last Modified :||12 Feb 2015 02:37|
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