University of Surrey

Test tubes in the lab Research in the ATI Dance Research

Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool

Jeynes, C, Barradas, NP, Marriott, PK, Boudreault, G, Jenkin, M, Wendler, E and Webb, RP (2003) Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool JOURNAL OF PHYSICS D-APPLIED PHYSICS, 36 (7). R97 - R126. ISSN 0022-3727

[img]
Preview
PDF
TopicalReview-CJcopyright.pdf
Available under License : See the attached licence file.

Download (4MB)
[img]
Preview
PDF (licence)
SRI_deposit_agreement.pdf

Download (33kB)
Item Type: Article
Additional Information: Copyright 2003 Institute of Physics. This is the author's accepted manuscript.
Uncontrolled Keywords: Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, RUTHERFORD BACKSCATTERING SPECTRA, SCATTERING CROSS-SECTION, AMORPHOUS GALLIUM NITRIDE, RESONANCE PLASMA SOURCE, MAXIMUM-ENTROPY METHOD, ELASTIC BACKSCATTERING, NUCLEAR MICROPROBE, SURFACE-ROUGHNESS, METAL/CERAMIC INTERFACES, METAL NANOPARTICLES
Related URLs:
Divisions: Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Depositing User: Symplectic Elements
Date Deposited: 16 Nov 2012 09:56
Last Modified: 06 Jul 2014 01:33
URI: http://epubs.surrey.ac.uk/id/eprint/732756

Actions (login required)

View Item View Item

Downloads

Downloads per month over past year


Information about this web site

© The University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom.
+44 (0)1483 300800