Summary of "IAEA intercomparison of IBA software"
Barradas, NP, Arstila, K, Battistig, G, Bianconi, M, Dytlewski, N, Jeynes, C, Kotai, E, Lulli, G, Mayer, M, Rauhala, E, Szilagyi, E and Thompson, M (2008) Summary of "IAEA intercomparison of IBA software" In: 18th International Conference on Ion Beam Analysis, 2007-09-23 - 2007-09-28, Univ Hyderabad, Sch Phys, Hyderabad, INDIA.
Available under License : See the attached licence file.
|Item Type:||Conference or Workshop Item (Paper)|
|Additional Information:||Copyright © 2007 Elsevier B.V. All rights reserved. NOTICE: this is the author’s version of a work that was accepted for publication in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 266, April 2008, DOI 10.1016/j.nimb.2007.10.043.|
|Uncontrolled Keywords:||Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, INSTRUMENTS & INSTRUMENTATION, NUCLEAR SCIENCE & TECHNOLOGY, PHYSICS, ATOMIC, MOLECULAR & CHEMICAL, PHYSICS, NUCLEAR, computer software, data analysis, simulation, ion beam analysis, silicon, stopping power, channelling, RBS, EBS, ERDA, NRA, glancing geometry, Monte Carlo, NDF, straggling, roughness, multiple scattering, resonance, ION-BEAM ANALYSIS, RUTHERFORD BACKSCATTERING SPECTRA, ELASTIC RECOIL DETECTION, MONTE-CARLO-SIMULATION, MULTIPLE-SCATTERING, CHANNELING SPECTRA, SURFACE-ROUGHNESS, SINGLE SCATTERING, DEPTH RESOLUTION, ENERGY-LOSS|
|Divisions:||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre|
|Depositing User:||Symplectic Elements|
|Date Deposited:||17 Oct 2012 08:19|
|Last Modified:||17 Jan 2015 14:43|
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