The use of the PeakForceTM quantitative nanomechanical mapping AFM-based method for high-resolution Young's modulus measurement of polymers
Young, TJ, Monclus, MA, Burnett, TL, Broughton, WR, Ogin, SL and Smith, PA (2011) The use of the PeakForceTM quantitative nanomechanical mapping AFM-based method for high-resolution Young's modulus measurement of polymers Measurement Science and Technology, 22 (12), 125703.
Young et al, Peak Force QNM.doc - Accepted version Manuscript
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Young_et_al,_Peak_Force_QNM.pdf - Accepted version Manuscript
PeakForceTM quantitative nanomechanical mapping (QNMTM) is a new atomic force microscopy technique for measuring Young's modulus of materials with high spatial resolution and surface sensitivity by probing at the nanoscale. In this work, modulus results from PeakForce™ QNM™ using three different probes are presented for a number of different polymers with a range of Young's moduli that were measured independently by instrumented (nano) indentation testing (IIT). The results from the diamond and silicon AFM probes were consistent and in reasonable agreement with IIT values for the majority of samples. It is concluded that the technique is complementary to IIT; calibration requirements and potential improvements to the technique are discussed.
|Divisions :||Faculty of Engineering and Physical Sciences > Mechanical Engineering Sciences|
|Identification Number :||https://doi.org/10.1088/0957-0233/22/12/125703|
|Additional Information :||Copyright 2011 Institute of Physics. This is the author's accepted manuscript.|
|Depositing User :||Symplectic Elements|
|Date Deposited :||05 Oct 2012 16:30|
|Last Modified :||23 Sep 2013 19:39|
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