The use of the PeakForceTM quantitative nanomechanical mapping AFM-based method for high-resolution Young's modulus measurement of polymers
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Young, TJ, Monclus, MA, Burnett, TL, Broughton, WR, Ogin, SL and Smith, PA (2011) The use of the PeakForceTM quantitative nanomechanical mapping AFM-based method for high-resolution Young's modulus measurement of polymers Measurement Science and Technology, 22 (12). ? - ?. ISSN 0957-0233
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Official URL: http://dx.doi.org/10.1088/0957-0233/22/12/125703
Abstract
PeakForceTM quantitative nanomechanical mapping (QNMTM) is a new atomic force microscopy technique for measuring Young's modulus of materials with high spatial resolution and surface sensitivity by probing at the nanoscale. In this work, modulus results from PeakForce™ QNM™ using three different probes are presented for a number of different polymers with a range of Young's moduli that were measured independently by instrumented (nano) indentation testing (IIT). The results from the diamond and silicon AFM probes were consistent and in reasonable agreement with IIT values for the majority of samples. It is concluded that the technique is complementary to IIT; calibration requirements and potential improvements to the technique are discussed.
| Item Type: | Article |
|---|---|
| Additional Information: | Copyright 2011 Institute of Physics. This is the author's accepted manuscript. |
| Divisions: | Faculty of Engineering and Physical Sciences > Mechanical Engineering Sciences |
| ID Code: | 722268 |
| Deposited By: | Symplectic Elements |
| Deposited On: | 05 Oct 2012 17:30 |
| Last Modified: | 11 May 2013 14:42 |
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