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Kinetics and Morphological Instabilities of Stressed Solid-Solid Phase Transformations

Rudawski, N G, Jones, K S and Gwillliam, R (2008) Kinetics and Morphological Instabilities of Stressed Solid-Solid Phase Transformations Physical Review Letters, 100 (16). ISSN 0031-9007

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Abstract

An atomistic model of the growth kinetics of stressed solid-solid phase transformations is presented. Solid phase epitaxial growth of (001) Si was used for comparison of new and prior models with experiments. The results indicate that the migration of crystal island ledges in the growth interface may involve coordinated atomic motion. The model accounts for morphological instabilities during stressed solid-solid phase transformations.

Item Type: Article
Additional Information: Published in <i>Physical Review Letters,</i> Vol. 100, Iss. 16. Copyright 2008 American Physical Society. Click <a href=http://prl.aps.org/>here</a> to access the journal's website.
Divisions: Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Depositing User: Mr Adam Field
Date Deposited: 27 May 2010 14:05
Last Modified: 23 Sep 2013 18:25
URI: http://epubs.surrey.ac.uk/id/eprint/72

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