University of Surrey

Test tubes in the lab Research in the ATI Dance Research

Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis

Jeynes, C, Zoppi, G, Forbes, I, Bailey, MJ and Peng, N (2009) Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis In: International Conference on Sustainable Power Generation and Supply, 2009-04-06 - 2009-04-07, Nanjing, PEOPLES R CHINA.

Available under License : See the attached licence file.

Download (640Kb)
PDF (licence)

Download (32Kb)


There are many technical challenges in the fabrication of devices from novel materials. The characterization of these materials is critical in the development of efficient photovoltaic systems. We show how the application of recent advances in MeV IBA, providing the self-consistent treatment of RBS (Rutherford backscattering) and PIXE (particle induced X-ray emission) spectra, makes a new set of powerful complementary depth profiling techniques available for all thin film technologies, including the chalcopyrite compound semiconductors. We will give and discuss a detailed analysis of a CuInAl metallic precursor film, showing how similar methods are also applicable to other films of interest.

Item Type: Conference or Workshop Item (Paper)
Additional Information:

Copyright 2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

Uncontrolled Keywords: Science & Technology, Technology, Energy & Fuels, Engineering, Electrical & Electronic, Engineering, Photovoltaic cell materials, Materials science and technology, Semiconductor films, Thin film devices, Ion beam applications, SIMULTANEOUS PIXE, CROSS-SECTION, RBS, SOFTWARE, IBA, DATAFURNACE, ROUGHNESS, SILICON
Related URLs:
Divisions: Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Depositing User: Symplectic Elements
Date Deposited: 12 Oct 2012 11:44
Last Modified: 23 Sep 2013 19:37

Actions (login required)

View Item View Item


Downloads per month over past year

Information about this web site

© The University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom.
+44 (0)1483 300800