University of Surrey

Test tubes in the lab Research in the ATI Dance Research

Pitfalls in Ion Beam Analysis

Jeynes, C and Barradas, NP (2009) Pitfalls in Ion Beam Analysis In: Handbook of Modern Ion Beam Materials Analysis. Materials Research Society, Warrendale Pennsylvania, 347 - 383. ISBN 1605112151

[img]
Preview
PDF
IBAPitfalls_NewHandbook.pdf
Available under License : See the attached licence file.

Download (674Kb)
[img]
Preview
PDF (licence)
SRI_deposit_agreement.pdf

Download (32Kb)

Abstract

Accurate elemental depth profiling by IBA is of great value to many modern thin-film technologies. IBA is a quantitative analytical technique now capable of traceable accuracy below 1%. In this chapter we describe sources of errors in data collection and analysis (pitfalls) greater than about 1/4%.

Item Type: Book Section
Uncontrolled Keywords: Science, Accelerators, Analytical methods, Rutherford backscattering spectrometry, Thin film depth profiling
Related URLs:
Divisions: Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Depositing User: Symplectic Elements
Date Deposited: 26 Oct 2012 08:48
Last Modified: 23 Sep 2013 19:37
URI: http://epubs.surrey.ac.uk/id/eprint/715433

Actions (login required)

View Item View Item

Downloads

Downloads per month over past year


Information about this web site

© The University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom.
+44 (0)1483 300800