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Ion beam induced charge imaging of epitaxial GaN detectors

Sellin, PJ, Hoxley, D, Lohstroh, A, Simon, A, Cunningham, W, Rahman, M, Vaitkus, J and Gaubas, E (2004) Ion beam induced charge imaging of epitaxial GaN detectors In: 5th International Workshop on Radiation Imaging Detectors, 2003-09-07 - 2003-09-11, Riga, LATVIA.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
AuthorsEmailORCID
Sellin, PJUNSPECIFIEDUNSPECIFIED
Hoxley, DUNSPECIFIEDUNSPECIFIED
Lohstroh, AUNSPECIFIEDUNSPECIFIED
Simon, AUNSPECIFIEDUNSPECIFIED
Cunningham, WUNSPECIFIEDUNSPECIFIED
Rahman, MUNSPECIFIEDUNSPECIFIED
Vaitkus, JUNSPECIFIEDUNSPECIFIED
Gaubas, EUNSPECIFIEDUNSPECIFIED
Date : 21 September 2004
Identification Number : https://doi.org/10.1016/j.nima.2004.05.078
Contributors :
ContributionNameEmailORCID
PublisherELSEVIER SCIENCE BV, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Particles & Fields, Spectroscopy, Physics, gallium nitride, radiation detector, ion beam induced charge imaging
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 28 Mar 2017 14:08
Last Modified : 28 Mar 2017 14:08
URI: http://epubs.surrey.ac.uk/id/eprint/712335

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