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EBIC and IBIC imaging on polyerystalline CdTe

Baier, N, Brambilla, A, Feuillet, G, Lohstroh, A, Renet, S and Sellin, P (2007) EBIC and IBIC imaging on polyerystalline CdTe In: 8th International Workshop on Radiation Imaging Detectors, 2006-07-02 - 2006-07-06, Pisa, ITALY.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Authors :
AuthorsEmailORCID
Baier, NUNSPECIFIEDUNSPECIFIED
Brambilla, AUNSPECIFIEDUNSPECIFIED
Feuillet, GUNSPECIFIEDUNSPECIFIED
Lohstroh, AUNSPECIFIEDUNSPECIFIED
Renet, SUNSPECIFIEDUNSPECIFIED
Sellin, PUNSPECIFIEDUNSPECIFIED
Date : 11 June 2007
Identification Number : https://doi.org/10.1016/j.nima.2007.01.109
Contributors :
ContributionNameEmailORCID
PublisherELSEVIER SCIENCE BV, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Particles & Fields, Spectroscopy, Physics, polycrystalline CdTe, EBIC, IBIC, grain boundaries, carriers mobility, carriers lifetime
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 28 Mar 2017 14:44
Last Modified : 28 Mar 2017 14:44
URI: http://epubs.surrey.ac.uk/id/eprint/712264

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