The potential for the application of X-ray photoelectron spectroscopy in forensic science
Watts, JF (2010) The potential for the application of X-ray photoelectron spectroscopy in forensic science SURFACE AND INTERFACE ANALYSIS, 42 (5). 358 - 362. ISSN 0142-2421
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Official URL: http://dx.doi.org/10.1002/sia.3192
Abstract
The potential for the use of X-ray photoelectron spectroscopy (XPS) in forensic science is reviewed, taking as a starting point a series of examples and case histories this review speculates on other areas where XPS may be able to make a contribution. The topics that are considered include chemical speciation of fingerprints, thin layers deposited on substrates as a result of explosions and/or fire, particulate materials and cosmetics and finally sequestration of marker elements and molecules on surfaces. It is concluded that XPS has much to offer the forensic science community but investigations may be hampered by the need to compare crimes scene specimens with known standards. Until this issue is addressed it is likely that XPS will continue to be used on an ad hoc basis for particularly challenging specimens in high profile cases.
| Item Type: | Article |
|---|---|
| Additional Information: | The definitive version is available at http://onlinelibrary.wiley.com/doi/10.1002/sia.3192/abstract |
| Uncontrolled Keywords: | Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, XPS, forensic science, fingerprints, cosmetics particulates |
| Divisions: | Faculty of Engineering and Physical Sciences > Mechanical Engineering Sciences |
| Related URLs: | |
| ID Code: | 712198 |
| Deposited By: | Symplectic Elements |
| Deposited On: | 11 Jul 2012 18:58 |
| Last Modified: | 22 May 2013 02:34 |
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