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The potential for the application of X-ray photoelectron spectroscopy in forensic science

Watts, JF (2010) The potential for the application of X-ray photoelectron spectroscopy in forensic science SURFACE AND INTERFACE ANALYSIS, 42 (5). 358 - 362. ISSN 0142-2421

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Abstract

The potential for the use of X-ray photoelectron spectroscopy (XPS) in forensic science is reviewed, taking as a starting point a series of examples and case histories this review speculates on other areas where XPS may be able to make a contribution. The topics that are considered include chemical speciation of fingerprints, thin layers deposited on substrates as a result of explosions and/or fire, particulate materials and cosmetics and finally sequestration of marker elements and molecules on surfaces. It is concluded that XPS has much to offer the forensic science community but investigations may be hampered by the need to compare crimes scene specimens with known standards. Until this issue is addressed it is likely that XPS will continue to be used on an ad hoc basis for particularly challenging specimens in high profile cases.

Item Type: Article
Additional Information: The definitive version is available at http://onlinelibrary.wiley.com/doi/10.1002/sia.3192/abstract
Uncontrolled Keywords: Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, XPS, forensic science, fingerprints, cosmetics particulates
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Divisions: Faculty of Engineering and Physical Sciences > Mechanical Engineering Sciences
Depositing User: Symplectic Elements
Date Deposited: 11 Jul 2012 17:58
Last Modified: 23 Sep 2013 19:33
URI: http://epubs.surrey.ac.uk/id/eprint/712198

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