Examination of the interface of a model adhesive joint by surface analysis: a study by XPS and ToF-SIMS
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Abel, M-L and Watts, JF (2009) Examination of the interface of a model adhesive joint by surface analysis: a study by XPS and ToF-SIMS SURFACE AND INTERFACE ANALYSIS, 41 (6). 508 - 516. ISSN 0142-2421
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Official URL: http://dx.doi.org/10.1002/sia.3055
Abstract
Model samples of the interface of an adhesive joint containing small levels of aminopropyl triethoxysilane (APS) have been prepared in order to examine the interface formed with an aluminium substrate. X-ray photoelectron (XPS) and time of flight secondary ion mass spectrometry (ToF-SIMS) has been used to analyse and image the interface region in between the aluminium and an epoxy adhesive in order to ascertain the reactions by the organosilane, present as a minor component within the system. It was found that APS was present at the interface between the adhesive and the substrate and that it had reacted with the substrate forming a covalent bond and was also crosslinked within the adhesive. Evidence of near to full hydrolysis of APS is also present within the spectra.
| Item Type: | Article |
|---|---|
| Additional Information: | The definitive version is available at http://onlinelibrary.wiley.com/doi/10.1002/sia.3055/abstract |
| Uncontrolled Keywords: | Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, organosilanes, epoxy adhesive, interface, XPS, ToF-SIMS, LOW-ANGLE MICROTOMY |
| Divisions: | Faculty of Engineering and Physical Sciences > Mechanical Engineering Sciences |
| Related URLs: | |
| ID Code: | 712196 |
| Deposited By: | Symplectic Elements |
| Deposited On: | 11 Jul 2012 17:40 |
| Last Modified: | 08 Jun 2013 16:02 |
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