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Examination of the interface of a model adhesive joint by surface analysis: a study by XPS and ToF-SIMS

Abel, M-L and Watts, JF (2009) Examination of the interface of a model adhesive joint by surface analysis: a study by XPS and ToF-SIMS SURFACE AND INTERFACE ANALYSIS, 41 (6). 508 - 516. ISSN 0142-2421

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Abstract

Model samples of the interface of an adhesive joint containing small levels of aminopropyl triethoxysilane (APS) have been prepared in order to examine the interface formed with an aluminium substrate. X-ray photoelectron (XPS) and time of flight secondary ion mass spectrometry (ToF-SIMS) has been used to analyse and image the interface region in between the aluminium and an epoxy adhesive in order to ascertain the reactions by the organosilane, present as a minor component within the system. It was found that APS was present at the interface between the adhesive and the substrate and that it had reacted with the substrate forming a covalent bond and was also crosslinked within the adhesive. Evidence of near to full hydrolysis of APS is also present within the spectra.

Item Type: Article
Additional Information: The definitive version is available at http://onlinelibrary.wiley.com/doi/10.1002/sia.3055/abstract
Uncontrolled Keywords: Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, organosilanes, epoxy adhesive, interface, XPS, ToF-SIMS, LOW-ANGLE MICROTOMY
Related URLs:
Divisions: Faculty of Engineering and Physical Sciences > Mechanical Engineering Sciences
Depositing User: Symplectic Elements
Date Deposited: 11 Jul 2012 16:40
Last Modified: 23 Sep 2013 19:33
URI: http://epubs.surrey.ac.uk/id/eprint/712196

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