The effect of silane incorporation on a metal adhesive interface: A study by electron energy loss spectroscopy
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Bertho, J, Stolojan, V, Abel, M-L and Watts, JF (2010) The effect of silane incorporation on a metal adhesive interface: A study by electron energy loss spectroscopy MICRON, 41 (2). 130 - 134. ISSN 0968-4328
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Official URL: http://dx.doi.org/10.1016/j.micron.2009.10.001
| Item Type: | Article |
|---|---|
| Additional Information: | NOTICE: this is the author’s version of a work that was accepted for publication in Micron. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Micron, 41(2), February 2010, DOI 10.1016/j.micron.2009.10.001 |
| Uncontrolled Keywords: | Science & Technology, Technology, Microscopy, EELS, Interface, Aluminium, Organosilane, LOW-ANGLE MICROTOMY, TOF-SIMS, ALUMINUM, ORGANOSILANE, CHEMISTRY, SURFACES, XPS |
| Divisions: | Faculty of Engineering and Physical Sciences > Mechanical Engineering Sciences |
| Related URLs: | |
| ID Code: | 712195 |
| Deposited By: | Symplectic Elements |
| Deposited On: | 11 Jul 2012 18:53 |
| Last Modified: | 25 Apr 2013 13:25 |
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